|
Lecturer Stanford University |
 |
Professor Subhasish Mitra directs the Robust Systems Group in the Department of Electrical Engineering and the Department of Computer Science of Stanford University, where he is the D.E. Chambers Faculty Scholar of Engineering. Before Stanford, he was a Principal Engineer at Intel Corporation.
Prof. Mitra’s research interests include robust system design, VLSI design, CAD, validation and test, and emerging nanotechnologies. His X-Compact technique for test compression has been used in more than 50 Intel products, and has influenced major CAD tools. The IFRA technology for post-silicon validation, created jointly with his student, was characterized as "a breakthrough" in a Research Highlight in the Communications of the ACM. His work on the first demonstration of carbon nanotube imperfection-immune VLSI circuits, jointly with his students and collaborators, was selected by the National Science Foundation (NSF) as a Research Highlight to the United States Congress, and was highlighted "as significant breakthrough" by the Semiconductor Research Corporation, the MIT Technology Review, and several others.
Prof. Mitra's honors include the Presidential Early Career Award for Scientists and Engineers from the White House, the highest US honor for early-career outstanding scientists and engineers, Terman Fellowship, IEEE CAS/CEDA Pederson Award for the IEEE Transactions on CAD Best Paper, and the Intel Achievement Award, Intel’s highest corporate honor.
He and his students presented award-winning papers at several major conferences:
IEEE/ACM Design Automation Conference, IEEE VLSI Test Symposium, IEEE
International Test Conference, and the Symposium on VLSI Technology. At Stanford, he was honored multiple times by graduating
seniors
"for being important to them during their time at Stanford."Prof.
Mitra currently serves on the Defense Advanced Research Projects Agency (DARPA) Information Science and Technology Board as
an invited member.