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Lecturer Cisco Systems, Inc. |
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Bill Eklow is a Distinguished Engineer at Cisco Systems, Inc. Bill’s areas of interest are: component test, board and system test and correlating board and system level failures to component defects. Bill is Chair of the IEEE 1149.6 Working Group and is an active member on the IEEE 1149.1 (Boundary-scan), P1687 (IJTAG), P1838 (3D Test Access) working groups. Bill is also the sub-group leader for the ITRS 3D Test Sub-group. Bill is a committee member for several conferences, workshops and symposia, including: International Test Conference, Board Test Workshop, 3D Test Workshop, Silicon Debug and Diagnosis Workshop, VLSI Test Symposium and ATE Vision Conference. Bill is an Eta Kappa Nu member, an IEEE Golden Core member and an IEEE Fellow.