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Lecturer Stanford University |
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Professor Subhasish Mitra directs the Robust Systems Group in the Department of Electrical Engineering and the Department of Computer Science of Stanford University, where he is the Chambers Faculty Scholar of Engineering. Prior to joining Stanford, he was a Principal Engineer at Intel Corporation.
Prof. Mitra’s research interests include robust system design, VLSI design, CAD, validation and test, and emerging nanotechnologies. His X-Compact technique for test compression has been used in more than 50 Intel products, and has influenced major Electronic Design Automation tools. The IFRA technology for post-silicon validation, created jointly with his student, was characterized as "a breakthrough" in a Research Highlight in the Communications of the ACM. His work on the first demonstration of carbon nanotube imperfection-immune digital VLSI, jointly with his students and collaborators, was selected by the NSF as a Research Highlight to the US Congress, and was highlighted as "a significant breakthrough" by the Semiconductor Research Corporation, the MIT Technology Review, the New York Times, and several others.
Prof. Mitra's major honors include the Presidential Early Career Award for Scientists and Engineers from the White House, the highest US honor for early-career outstanding scientists and engineers, Terman Fellowship, IEEE CAS/CEDA Pederson Award for the IEEE Trans. CAD Best Paper, and the Intel Achievement Award, Intel’s highest corporate honor. He and his students presented award-winning papers at several major conferences: IEEE/ACM Design Automation Conference, IEEE International Test Conference, IEEE VLSI Test Symposium, and the Symposium on VLSI Technology.
Prof. Mitra has served on numerous conference committees and journal editorial boards. He recently served on DARPA’s Information Science and Technology Board as an invited member.