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Lecturer Intel Corporation |
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Dr. Srikanth Venkataraman is a Principal Engineer at Intel Corporation in Hillsboro, OR. He is a strategic planner for test and post-silicon solutions, and manages a group responsible for developing CAD tools for diagnosis, debug and test quality applications in the Design and Technology Solutions group. He has successfully developed and deployed several tools in test, debug and diagnosis used all across Intel. His interests include the areas of VLSI Test (product design for testability and test CAD), Fault diagnosis, Design Verification and Debug, DFM, CAD for VLSI, S/W Engineering and Development. He received his Ph.D. in Electrical and Computer Engineering from the University of Illinois at Urbana-Champaign. He has worked at Texas Instruments and ViewLogic Systems (Sunrise Test System). He has over 60 publications, 3 patents issued and 3 patents pending. He received the best paper award at IEEE VLSI Test Symposium 2000, top 10 papers at IEEE International Test Conference 2000 and the best panel at the IEEE VLSI Test Symposium 99. Intel awards include two Intel Achievement Award (2011, 2006), seven Divisional Recognition Awards (2000, 2002, 2004, 2009 and 2010), Technical Recognition Award (2002), Excellence Award (2001), Discover Award (2000), best papers at Intel Design and Test Technology Conference (2002, 2003). He has presented tutorials on diagnosis, DFM, test and debug at the IEEE Design Automation Conference 2006, ISQED 2007, VLSI Test Symposium 2006, 2004 and 2003, IEEE International Test Conference 2011, 2010, 2008, 2006 and 2004, Design Automation and Test in Europe 2004, European Test Symposium 2009 and 2006, VLSI Design Conference 2008 and 2006, and International Symposium on Testing and Failure Analysis 2008, 2007, 2006, 2004 and 2003.