The Test Spring School (TSS@ETS) is the main international event where Ph.D. and M.Sc. students can learn about the leading edge semiconductor test technology. Traditionally, renowned experts from academia and industry guarantee an exciting program introducing into the challenges of reliability, test and diagnosis.
The overall theme of this year is AI for IC dependability and dependability of AI ICs. Leading experts will give lectures and cover the main challenges and solutions in this field.
The European Test Symposium (ETS'22) will be organised as a hybrid event, while, the preceeding TSS@ETS 2022 will be organised as a fully "in person" event. As in previous years, the spring school will give the opportunity to earn credits and a certificate by passing an online exam. To maintain the typical TSS atmosphere and support interaction during the event, the number of participants is strictly limited to 30 on a first-come first-serve basis.
Registered TSS students will benefit from
- access to all the lectures
- Q & A meeting with the lecturers
- Social activities
- Lodging and meals
The spring school is a joint effort of the TIMA Laboratory and Sorbonne University. It is organized in conjunction with ETS 2022.
The spring school is also organized in cooperation with the Graduate School Intelligent Methods for Test and Reliability .
