Erik Jan Marinissen

Lecturer

IMEC vzw

Kapeldreef 75
B-3001 Leuven
Belgium


Erik Jan Marinissen received the MSc degree in Computing Science and the PDEng degree in Software Technology from Eindhoven University of Technology in 1990 and 1992, respectively. He is currently a Principal Scientist at IMEC in Leuven, Belgium. Prior to IMEC, he was with NXP Semiconductors and Philips Research, both in Eindhoven, The Netherlands. Marinissen’s research interests include all topics in the domain of test and debug of integrated circuits. He is a co-author of more than 125 journal and conference papers and a co-inventor of eight granted US and EU patent families.

He is a recipient of Best Paper Awards at the Chrysler-Delco-Ford Automotive Electronics Reliability Workshop in 1995, the IEEE International Board Test Workshop in 2002, and the Most Significant Paper Award at the IEEE International Test Conference in 2008. Marinissen served as an Editor-in-Chief of IEEE Std. 1500.

He serves on numerous conference committees, including Asian Test Symposium (ATS), Design, Automation and Test in Europe (DATE), European Test Symposium (ETS), International Test Conference (ITC), and VLSI Test Symposium (VTS), and on the editorial boards of IEEE ’Design & Test of Computers’, IET ’Computers and Digital Techniques’ (IET-CDT), and Springer’s ’Journal of Electronic Testing: Theory and Applications’ (JETTA).

He is a Senior Member of IEEE and a Golden Core Member of Computer Society.