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Lecturer Auburn University |
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Adit D. Singh received the B.Tech from IIT Kanpur, and the M.S. and Ph.D. from Virginia Tech, all in Electrical Engineering. Currently he is James B. Davis Professor of Electrical and Computer Engineering at Auburn University. Earlier, he has held faculty positions at the University of Massachusetts, Amherst and Virginia Tech in Blacksburg.
His research interests span high performance VLSI systems, IC and SOC testing, and microelectronic system reliability and fault tolerance. He has published extensively in these areas, and holds several international patents that have been licensed to industry. He is particularly recognized for his pioneering contributions to statistical methods in test and adaptive testing. In addition to extensive support from US the National Science Foundation, his research has also been supported by the Max Plank Society of Germany, and the Fulbright Foundation. He is a very popular lecturer and over the years has been invited to present over sixty technical courses at international conferences, and in-house in companies.
Dr. Singh currently serves as Chair of the IEEE Test Technology Technical Council, and on the editorial boards of IEEE Design and Test Magazine and the Journal of Test and Test Applications (JETTA). He has held leadership positions in dozens of technical conferences, most recently serving as Co-General Chair for the 2010 IEEE International Workshop on Reliability Aware Design and Test (RASDAT-10), and Co-Program Chair of the 2009 IEEE international Workshop on Design for Variability and Reliability (DRV09). He is a Fellow of the IEEE, and a “Golden Core” member of the IEEE Computer Society.