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Lecturer Delft University of Technology |
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Said Hamdioui received the MSEE and PhD degrees (both with honors) from the Delft University of Technology (TUDelft), Delft, The Netherlands. He is currently associate Professor at the Computer Engineering Lab. of TUDelft. Prior to joining TUDelft, Hamdioui worked for Microprocessor Products Group at Intel Corporation (in Santa Clara and Folsom, Califorina), for IP and Yield Group at Philips Semiconductors R&D (Crolles, France) and for DSP design group at Philips/ NXP Semiconductors (Nijmegen, The Netherlands). He is the recipient of European Design Automation Association (EDAA) Outstanding Dissertation Award 2001, for his work on memory test techniques that have a wide-spread proliferation in the chip design industry; he is the winner of IEEE Nano and Nano Korea award at IEEE NANO 2010 - Joint Symposium with Nano Korea. He has received The Young Academy (DJA) of the Royal Netherlands Academy of Arts and Sciences (KNAW) nomination in 2009.
Hamdioui has published one book and over 80 papers in refereed journals and conferences. His research interests include dependable nano-computing and VLSI Test (defect/fault tolerance, reliability, security, nano-architectures, Design-for-Testability, Built-In-Self-Test, 3D stacked IC test, memory test, etc). He serves on numerous conference committees and is a member of IEEE.