Peter Maxwell

Lecturer

Aptina Imaging

3080 North First St
San Jose, CA 95134
USA


Peter Maxwell is an IEEE Fellow. He works for Aptina Imaging, where he is responsible for test and DFT for CMOS image sensors. He received the B.Sc. and M.Sc. (Honours) degrees from the University of Auckland, New Zealand, and the Ph.D. degree from the Australian National University.

His interests include test methodologies, design for testability, and their application for yield improvement and test time reduction. He has spent many years co-ordinating test experiments and was one of the first to widely publish industrial data on test effectiveness.