Biography

Yiorgos received the Diploma of Computer Engineering and Informatics from the University of Patras, Greece, in 1995 and the M.S. and Ph.D. degrees in Computer Engineering from the University of California, San Diego, in 1998 and 2001, respectively. After spending a decade on the faculty of Yale University, he joined UT Dallas where he is now a Professor of Electrical Engineering, leading the Trusted and RELiable Architectures (TRELA) Research Laboratory. His research focuses on applications of machine learning and statistical analysis in the development of trusted and reliable integrated circuits and systems, with particular emphasis in the analog/RF domain. He is also investigating error detection and correction methods for modern microprocessors, as well as novel computational modalities using emerging technologies. He is the 2016-2017 general chair and was the 2013-2014 program chair of the IEEE VLSI Test Symposium as well as the 2010-2012 program chair of the Test Technology Educational Program (TTEP). He is as an associate editor of the IEEE Transactions on Information Forensics and Security, the IEEE Design & Test periodical and the Springer Journal of Electronic Testing: Theory and Applications and he has also served as a guest editor for the IEEE Transactions on Computers and the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, and as a topic coordinator and/or program committee member for several IEEE and ACM conferences. He is a Senior Member of the IEEE, a recipient of the 2006 Sheffield Distinguished Teaching Award and a recipient of the Best Paper Award from the 2013 Design Automation and Test in Europe (DATE'13) conference and the 2015 IEEE VLSI Test Symposium. His research activities have been supported by NSF, ARO, SRC, DARPA, Boeing, IBM, LSI, Intel, and Texas Instruments.