Toggle navigation
Home
Program
Venue
People
Lectures
Fundamental Machine Learning Techniques [M. Polycarpou]
Wafer Level Screening Techniques [J. Carulli]
Circuit and Gate Level Learning Techniques [M. Tahoori]
Applications of Machine Learning in the Design of Reliable and Trusted Analog/RF ICs [Y. Makris]
Machine Learning Techniques for System Level Test and Diagnosis [K. Chakrabarty]
Self-Awareness and resilience against faults, bugs and attacks [A. Jantsch]
E-learning
Contact
Links
ETS 17
IEEE-ETS
TSS 19
TSS 18
TSS 17
TSS 16
TSS 15
TSS 14
TSS 13
TSS 12
TSS 11
TSS 10
Schedule
Friday 19 May 2017
18:00-19:30
School overview and personal introduction of attendees
20:00
Dinner
Saturday 20 May 2017
07:30-08:30
Registration
08:30-10:00
Lecture 1: Fundamental Machine Learning Techniques
[M. Polycarpou]
10:00-10:30
Break: Coffee
10:30-12:00
Lecture 1: Fundamental Machine Learning Techniques
[M. Polycarpou]
12:00-13:30
Break: Lunch
13:30-14:30
Lecture 1: Fundamental Machine Learning Techniques
[M. Polycarpou]
14:30-15:30
Lecture 2: Wafer Level Screening Techniques
[J. Carulli]
15:30-16:00
Break: Coffee
16:00-18:00
Lecture 2: Wafer Level Screening Techniques
[J. Carulli]
18:15
Social Event: City Tour and dinner (depart from hotel at 18:15)
Sunday 21 May 2017
08:00-09:00
Lecture 2: Wafer Level Screening Techniques
[J. Carulli]
09:00-10:00
Lecture 3: Circuit and Gate Level Learning Techniques
[M. Tahoori]
10:00-10:30
Break: Coffee
10:30-12:30
Lecture 3: Circuit and Gate Level Learning Techniques
[M. Tahoori]
12:30-14:00
Break: Lunch
14:00-15:00
Lecture 3: Circuit and Gate Level Learning Techniques
[M. Tahoori]
15:00-15:15
Break: Coffee
15:15-16:30
Lecture 4: Applications of Machine Learning in the Design of Reliable and Trusted Analog/RF ICs
[Y. Makris]
17:00
Social Event: Beach Party at Larnaca
Monday 22 May 2017
08:00-09:30
Lecture 4: Applications of Machine Learning in the Design of Reliable and Trusted Analog/RF ICs
[Y. Makris]
09:30-09:45
Break: Coffee
09:45-11:00
Lecture 4: Applications of Machine Learning in the Design of Reliable and Trusted Analog/RF ICs
[Y. Makris]
11:00-11:15
Check out
11:15-14:00
Travel, lunch and sightseeing
14:00-16:00
Lecture 5: Machine Learning Techniques for System Level Test and Diagnosis
[K. Chakrabarty]
14:00-16:00
Lecture 6: Self-Awareness and resilience against faults, bugs and attacks
[A. Jantsch]
16:00-16:30
Break: Coffee
16:30-18:30
Lecture 5: Machine Learning Techniques for System Level Test and Diagnosis
[K. Chakrabarty]
16:30-18:30
Lecture 6: Self-Awareness and resilience against faults, bugs and attacks
[A. Jantsch]