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Lectures
- Wafer Level Reliability Screens and Adaptive Test [P. Maxwell]
- Dependability of Emerging Systems and Technologies [R. Aitken]
- Spin as State Variable for Computation: Prospects and Perspectives [K. Roy]
- The Coming of Age of Microfluidic Biochips: Design Automation, Test, and Error Recovery for Biochemistry-on-a-Chip [K. Chakrabarty]
- Future of FET devices in Terascale computing era [Y. Zorian]
- Test and Design-for-Test of 2.5D- and 3D-Stacked Integrated Circuits [E. J. Marinissen]
