Schedule

Friday 22 May 2015
17:00-19:00 Registration
19:00 Welcome Reception and Dinner (at TSS Venue)
Opening Session: Each Attendee Introduces Her/Himself (at TSS Venue)
Saturday 23 May 2015
07:30-08:30 Registration
08:30-10:40 Lecture 1: Wafer Level Reliability Screens and Adaptive Test [P. Maxwell]
10:40-11:00 Break: Coffee
11:00-13:10 Lecture 1: Wafer Level Reliability Screens and Adaptive Test [P. Maxwell]
13:10-14:10 Break: Lunch
14:10-16:20 Lecture 2: Dependability of Emerging Systems and Technologies [R. Aitken]
16:20-16:40 Break: Coffee
16:40-18:50 Lecture 2: Dependability of Emerging Systems and Technologies [R. Aitken]
19:30 Dinner at TSS Venue
Sunday 24 May 2015
08:30-10:40 Lecture 3: Spin as State Variable for Computation: Prospects and Perspectives [K. Roy]
10:40-11:00 Break: Coffee
11:00-13:00 Lecture 3: Spin as State Variable for Computation: Prospects and Perspectives [K. Roy]
13:00-14:00 Break: Lunch
14:00-16:00 Lecture 4: The Coming of Age of Microfluidic Biochips: Design Automation, Test, and Error Recovery [K. Chakrabarty]
16:00 Social: Visit to the National Ethnographic Park "Romulus Vuia", ending with a traditional picnic.
Monday 25 May 2014
08:30-09:30 Lecture 4: The Coming of Age of Microfluidic Biochips: Design Automation, Test, and Error Recovery [K. Chakrabarty]
09:30-09:50 Break: Coffee
09:50-10:50 Lecture 4: The Coming of Age of Microfluidic Biochips: Design Automation, Test, and Error Recovery [K. Chakrabarty]
10:50-11:30 Check out
11:30-12:30 Break: Lunch
12:30-13:00 Change of Venue
13:00-18:00 Lecture 5: Future of FET devices in Terascale computing era [Y. Zorian]
13:00-18:00 Lecture 6: Test and Design-for-Test of 2.5D- and 3D-Stacked Integrated Circuits [E. J. Marinissen]