Biography

Peter Maxwell works for ON Semiconductor, where he is responsible for test and DFT for CMOS image sensors. He received the B.Sc. and M.Sc. (Honours) degrees from the University of Auckland, New Zealand, and the Ph.D. degree from the Australian National University. He is a Fellow of the IEEE.

His interests include test methodologies, design for testability, and their application for yield improvement and test time reduction. He has spent many years coordinating test experiments and was one of the first to widely publish industrial data on test effectiveness.