Erik Jan Marinissen is Principal Scientist at IMEC in Leuven, Belgium. Prior to IMEC, he was with NXP Semiconductors and Philips Research, both in Eindhoven, the Netherlands. He received an MSc degree in Computing Science and a PDEng degree in Software Technology from Eindhoven University of Technology in 1990 and 1992, respectively. Marinissen’s research interests include all topics in the domain of test and debug of ICs. He is co-author of more than 220 journal and conference papers and co-inventor of twelve granted international patent families. He is a recipient of Best Paper Awards at the Chrysler-Delco-Ford Automotive Electronics Reliability Workshop in 1995, the IEEE International Board Test Workshop in 2002, and the Most Significant Paper Awards at the IEEE International Test Conference in 2008 and 2010. Marinissen served as an Editor-in-Chief of IEEE Std 1500 and serves as Working Group Chair of IEEE P1838. He serves on the organization and program committees of numerous conferences; amongst others he has been General Chair of ETW’03 and Program Chair of DDECS’12, ETS’06, and DATE’13. He is a founder of workshops on ‘Diagnostic Services in Network-on-Chips’, ‘3D Integration’, and ‘3D-TEST’. Marinissen serves on the editorial boards of IEEE ‘Design & Test’, IET ‘Computers and Digital Techniques’, and Springer’s ‘Journal of Electronic Testing: Theory and Applications’. He is a Fellow of IEEE and a Golden Core Member of Computer Society. Marinissen presented full-day tutorials on the topic of modular SOC testing at ATS, DATE, ETW, ITC, and VTS and on the topic of 3D-SIC testing at 3DIC, 3D-ASIP, DATE, and ITC.