Lectures
Production Testing of Digital SOCs and New Challenges
Adit Singh - Auburn University, US.
A Future History of Practical AMS DfT
Stephen Sunter - Siemens Digital Industries Software, CA
Assessing the ANN reliability: issues, strategies and opportunities
Ernesto Sanchez Sanchez - Politecnico di Torino, IT
Introduction into Hardware-oriented Security
Ilia Polian - University of Stuttgart, DE
Machine Learning in Logic Circuit Diagnosis
Shawn Blanton - Carnegie Mellon University, US
Silicon Lifecycle Management
Yervant Zorian - Synopsis, US