People

Adit Singh

Auburn University, USA

Biography

Adit Singh is Godbold Endowed Chair and Professor of Electrical and Computer Engineering at Auburn University, USA. He earlier served on the faculties of the University of Massachusetts in Amherst, and Virginia Tech in Blacksburg, and on visiting positions at the University of Tokyo, Japan, the Universities of Freiburg and Potsdam in Germany, the Indian Institute of Technology, and as a Fulbright scholar at the University Polytechnic of Catalonia in Barcelona, Spain. His technical interests span all aspects of VLSI technology, in particular integrated circuit test and reliability. He has published over three hundred research papers and holds international patents licensed to industry. He has served as a consultant to several semiconductor and EDA companies, including as an expert witness for major patent litigation cases. He has had leadership roles as General Chair/Co-Chair/Program Chair for dozens of international VLSI design and test conferences. He served two terms (2007-11) as Chair of the IEEE Test Technology Technical Council (TTTC), and (2011-15) on the Board of Governors of the IEEE Council on Design Automation (CEDA). Professor Singh received his B.Tech from IIT Kanpur, and the M.S. and Ph.D. from Virginia Tech, all in Electrical Engineering. He is a Life Fellow of IEEE.

Stephen Sunter

Siemens Digital Industries Software, CA

Biography

Steve received his BASc in EE from the University of Waterloo, Canada, in 1978.  After designing CCD and switched-capacitor filters, he was primary designer for the first single-chip digital-signalling telephone in 1982, then manager for standard cell library development until 1990, digital ATPG development until 1992, and mixed-signal testing until 1995, in Ottawa, Canada. Since then, he has been the Engineering Director for mixed-signal DfT at LogicVision, then Mentor Graphics, which is now Siemens Digital Industries Software. His development activities focus on parametric BIST of IC functions ranging from SerDes and PLLs to DDR I/Os and ADCs, as well as general analog DfT and defect simulation.  He has served as Chair or Vice-Chair of the International Mixed-Signal Workshop (IMSTW) three times, and on the Program Committees of the International Test Conference (ITC), VLSI Test Symposium (VTS), European Test Symposium (ETS), IEEE Test Technology Education Program (TTEP), Design and Test Europe (DATE), and various IEEE Workshops, and is currently an Associate Editor of the Springer Journal of Electronic Testing: Theory & Applications.  He has been a member, Vice-Chair or Chair of every IEEE Standard Working Group related to AMS DfT, including 1149.4, 1149.6, 1149.8.1, 1149.10, P1687.2, and P2427, and is a Life Senior Member of IEEE.  He has authored about 30 U.S. patents and 70 papers on these topics and received the most ITC awards of any primary author: 1999 and 2002 Honourable Mention Paper Awards, and 2005 and 2019 Best Paper Awards.

Ernesto Sanchez Sanchez

Politecnico di Torino

Biography

Ernesto Sanchez is an Associate professor at Politecnico di Torino, Italy. His research interests include digital circuits and systems reliability, evolutionary computation and ANN reliability. He received his degree in Electronic Engineering from Universidad Javeriana, Colombia in 2000, and his Ph.D. degree in computing engineer from Politecnico di Torino in 2006. He is an IEEE  senior member.

Ilia Polian

University of Stuttgart, DE

Biography

Ilia Polian received the Diploma M.Sc. and Ph.D. degrees from the University of Freiburg, Germany, in 1999 and 2003, respectively. He is a Full Professor and the Director of the Institute for Computer Architecture and Computer Engineering, University of Stuttgart, Germany. Prof. Polian coauthored over 200 scientific publications; he is the Coordinator of the German DFG-funded Priority Program u201cNano Securityu201d and a Director of the Graduate School Intelligent Methods for Test and Reliability in Stuttgart. His scientific interests include hardware-oriented security, emerging architectures, test methods, and quantum computing. He received two Best Paper Awards.

Shawn Blanton

Carnegie Mellon University, US

Biography

Shawn Blanton is the Joseph F. and Nancy Keithley Professor of Electrical and Computer Engineering (ECE) Department at Carnegie Mellon University, where he also serves as the departmentu2019s Associate Head of Research. His research interests are housed in the Advanced Chip Testing Laboratory (www.ece.cmu.edu/~actl) and include the design, test, diagnosis and security of integrated systems. He has published over 200 papers in these areas and has several issued and pending patents. Prof. Blanton has received the National Science Foundation Career Award for the development of a microelectromechanical systems (MEMS) testing methodology, and several industrial faculty awards from companies such as IBM, Qualcomm, Google, Teradyne and CISCO. He is a Fellow of the IEEE, and senior member of the ACM. Professor Blanton served as the Acting Associate Dean of Diversity and Inclusion for the College of Engineering from 2019-2020, and the Interim Vice Provost for Diversity, Equity and Inclusion for Carnegie Mellon University from 2020-2021. Professor Blanton is the recipient of the 2006 Emerald Award for outstanding leadership in recruiting and mentoring minorities for advanced degrees in science and technology; the 2021 College of Engineering Mentoring Award in recognition of excellence in mentoring of graduates students and junior faculty; and the 2022 National Science of Black Engineeru2019s Lifetime Achievement in Academia Award for exhibiting career technical excellence and leadership in higher education in a career spanning several years.

Yervant Zorian

Synopsis, US

Biography

Yervant Zorian is a Chief Architect and Fellow at Synopsys, as well as President of Synopsys Armenia. Formerly, he was Vice President and Chief Scientist of Virage Logic, Chief Technologist at LogicVision, and a Distinguished Member of Technical Staff AT&T Bell Laboratories. He is currently the President of IEEE Test Technology Technical Council (TTTC), the founder and chair of the IEEE 1500 Standardization Working Group, the Editor-in-Chief Emeritus of the IEEE Design and Test of Computers and an Adjunct Professor at University of British Columbia. He served on the Board of Governors of Computer Society and CEDA, was the Vice President of IEEE Computer Society, and the General Chair of the 50th Design Automation Conference (DAC) and several other symposia and workshops.

Dr. Zorian holds 35 US patents, has authored four books, published over 350 refereed papers and received numerous best paper awards. A Fellow of the IEEE since 1999, Dr. Zorian was the 2005 recipient of the prestigious Industrial Pioneer Award for his contribution to BIST, and the 2006 recipient of the IEEE Hans Karlsson Award for diplomacy. He received the IEEE Distinguished Services Award for leading the TTTC, the IEEE Meritorious Award for outstanding contributions to EDA, and in 2014, the Republic of Armeniau2019s National Medal of Science.

He received an MS degree in Computer Engineering from University of Southern California, a PhD in Electrical Engineering from McGill University, and an MBA from Wharton School of Business, University of Pennsylvania.

Elena-Ioana Vatajelu

TSS Co-Chair, TIMA Laboratory, FR

ioana.vatajelu@univ-grenoble-alpes.fr

Haralampos Stratigopoulos

TSS Co-Chair, Sorbonne University, LIP6, FR

haralampos.stratigopoulos@lip6.fr