- Home
- Program
- Venue
- People
-
Lectures
- Introduction to VLSI Test Technology [A. Singh]
- Fault modeling, fault simulation and ATPG [B. Becker]
- Embedded Test: From Test Compression to Logic Built-In Self-Test [J. Rajski]
- Defect based testing [M. Renovell]
- Mixed-signal/RF design-for-test: principles and advanced techniques [S. Mir]
- Production test practices - How they vary and why? [J. Rivoir]
- Archive
